发明名称 MEMORY KINK CHECKING
摘要 This disclosure concerns memory kink checking. One embodiment includes selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line. An effect on a second data line is determined, due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line. A kink correction is applied to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell.
申请公布号 EP2478523(A4) 申请公布日期 2013.06.26
申请号 EP20100815733 申请日期 2010.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 CHANDRASEKHAR, UDAY;HELM, MARK
分类号 G11C16/10;G11C16/04;G11C16/34 主分类号 G11C16/10
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