发明名称 |
Sample gas analyzing device and computer program for the same |
摘要 |
A sample gas analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample gas by performing a multivariate analysis using a spectral spectrum obtained by irradiating light to the sample gas, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components. |
申请公布号 |
EP2607885(A2) |
申请公布日期 |
2013.06.26 |
申请号 |
EP20120008567 |
申请日期 |
2012.12.21 |
申请人 |
HORIBA, LTD. |
发明人 |
ITAYA, TAKAHIRO;NAKATANI, SHIGERU |
分类号 |
G01N21/3504;G01J3/453;G01N21/35 |
主分类号 |
G01N21/3504 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|