| 摘要 |
A magnetic property analyzing apparatus includes a first computing unit to perform a magnetic field analysis utilizing a FEM using an average magnetization given with respect to each of elements to which an analyzing target is segmented, and a second computing unit that computes an effective magnetic field acting on each element using a magnetic field computed by the magnetic field analysis, computes magnetization vectors within each element by obtaining a time integral of a LLG equation using the effective magnetic field, and computes an average magnetization for each element by averaging the magnetization vectors. |
