发明名称 METHOD FOR PRODUCING TRANSISTOR
摘要 <p>According to the present invention, there is provided a process for producing a transistor having a high precision and a high quality with a high yield by selectively etching a natural silicon oxide film, and further by selectively etching a dummy gate made of silicon. The present invention relates to a process for producing a transistor using a structural body which includes a substrate, and a dummy gate laminate formed by laminating at least a high dielectric material film and a dummy gate made of silicon having a natural silicon oxide film on a surface thereof, a side wall disposed to cover a side surface of the laminate and an interlayer insulating film disposed to cover the side wall which are provided on the substrate, said process including an etching step using a specific etching solution and thereby replacing the dummy gate with an aluminum metal gate.</p>
申请公布号 EP2608249(A1) 申请公布日期 2013.06.26
申请号 EP20110818031 申请日期 2011.07.26
申请人 MITSUBISHI GAS CHEMICAL COMPANY, INC. 发明人 SHIMADA, KENJI;MATSUNAGA, HIROSHI;ABE, KOJIRO;YAMADA, KENJI
分类号 H01L21/311;H01L21/321;H01L21/336;H01L21/8234;H01L21/8238 主分类号 H01L21/311
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