发明名称 Method for forming a multilayer structure
摘要 The method for forming a multilayer structure on a substrate comprises providing a stack successively comprising an electron hole blocking layer, a first layer made from N-doped semiconductor material having a dopant concentration greater than or equal to 1018 atoms/cm3 or P-doped semiconductor material, and a second layer made from semiconductor material of different nature. A lateral electric contact pad is made between the first layer and the substrate, and the material of the first layer is subjected to anodic treatment in an electrolyte.
申请公布号 US8470689(B2) 申请公布日期 2013.06.25
申请号 US201113293652 申请日期 2011.11.10
申请人 DESPLOBAIN SEBASTIEN;GAILLARD FREDERIC-XAVIER;MORAND YVES;NEMOUCHI FABRICE;COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIESALTERNATIVES;STMICROELECTRONICS (CROLLES 2) SAS 发明人 DESPLOBAIN SEBASTIEN;GAILLARD FREDERIC-XAVIER;MORAND YVES;NEMOUCHI FABRICE
分类号 H01L21/30 主分类号 H01L21/30
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