发明名称 Circuit for detection of failed solder-joints on array packages
摘要 A circuit for detecting changes in resistance at a solder joint connecting a constant voltage source supplying a first voltage and a pin of an array package during operation of the array package includes: a test circuit for applying a second voltage different from the first voltage at a side of the solder joint opposite the constant voltage source; and a monitoring circuit for monitoring an output of the test circuit, wherein the test circuit is configured to output the first voltage when the resistance at the solder joint is below a threshold value, and to output a voltage other than the first voltage when the resistance at the solder joint is above the threshold value, and wherein the monitoring circuit is configured to indicate a failure of the solder joint connection when the voltage other than the first voltage is output by the test circuit.
申请公布号 US8471567(B2) 申请公布日期 2013.06.25
申请号 US201113035362 申请日期 2011.02.25
申请人 CLARKSON ROBERT R.;RAYTHEON COMPANY 发明人 CLARKSON ROBERT R.
分类号 G01R31/04;G01R31/08 主分类号 G01R31/04
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