| 摘要 |
A stored-pattern logic self-test system includes a memory, a device under test and a test controller. The memory stores test pattern data including test stimuli. The device under test includes a scan chain and a test access port configurable to control operation of the scan chain. The test controller is configured to test the device under test by controlling the memory to output the test stimuli to the device under test. The test controller controls the test access port to load the test stimuli into the scan chain, and receives and evaluates response data from the device under test.
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