发明名称 Semiconductor device and method for manufacturing semiconductor device
摘要 A semiconductor device includes a second oxide film and a pad electrode on a first oxide film that is formed on a front surface of a semiconductor substrate, a contact electrode and a first barrier layer formed in the second oxide film and connected to the pad electrode, a silicide portion formed between the contact electrode and a through-hole electrode layer and connected to the contact electrode and the first barrier layer, a via hole extending from a back surface of the semiconductor substrate to reach the silicide portion and the second oxide film, a third oxide film formed on a sidewall of the via hole and on the back surface of the semiconductor substrate, and a second barrier layer (H) and a rewiring layer formed inside the via hole and on the back surface of the semiconductor substrate and connected to the silicide portion.
申请公布号 US8471367(B2) 申请公布日期 2013.06.25
申请号 US201013377940 申请日期 2010.11.01
申请人 SAITO DAISHIRO;KAI TAKAYUKI;OKUMA TAKAFUMI;YAMANISHI HITOSHI;PANASONIC CORPORATION 发明人 SAITO DAISHIRO;KAI TAKAYUKI;OKUMA TAKAFUMI;YAMANISHI HITOSHI
分类号 H01L23/48;H01L21/3205;H01L21/44;H01L23/04;H01L23/52;H01L29/40 主分类号 H01L23/48
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