发明名称 Process for enhancing dye polymer recording yields by pre-scanning coated substrate for defects
摘要 A method for enhancing recording yields by monitoring dye polymer formation on a glass substrate is provided. After the glass substrate is coated with a dye polymer layer and before pits are formed on the dye-polymer coated glass, the dye polymer coated glass substrate is scanned to detect defects. The dye-polymer coated glass is discarded on the one hand if the defects detected through the scanning are at or above an unacceptable threshold level, and on the other hand data is written on the dye-polymer coated glass if the defects detected through the scanning are below the unacceptable threshold level.
申请公布号 US8472020(B2) 申请公布日期 2013.06.25
申请号 US20050057941 申请日期 2005.02.15
申请人 SWEENEY THOMAS I.;CINRAM GROUP, INC. 发明人 SWEENEY THOMAS I.
分类号 G01N21/00;G11B7/24 主分类号 G01N21/00
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