发明名称 METHOD FOR FORMING WIRING PATTERN, AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for forming a stable wiring pattern, and a semiconductor device. <P>SOLUTION: The method for forming a wiring pattern according to the present embodiment comprises the steps of: forming an insulating pattern having a side surface on a main surface of a substrate; forming a self-assembled film having an affinity for a material of the insulating pattern, on the side surface of the insulating pattern; and depositing a conductive material on a side surface of the self-assembled film to form a conductive layer. The method for forming a wiring pattern also comprises the steps of: covering the periphery of the conductive layer with an insulating interlayer film, on the main surface; and exposing the conductive layer from a surface of the interlayer film. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013125905(A) 申请公布日期 2013.06.24
申请号 JP20110274772 申请日期 2011.12.15
申请人 TOSHIBA CORP 发明人 YOSHIMIZU YASUTO;WAKATSUKI SATOSHI;OGUCHI HISASHI;SAKATA ATSUKO;TOMITA HIROSHI
分类号 H01L21/768;C23C18/18;H01L21/28;H01L21/288;H01L21/3205 主分类号 H01L21/768
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