发明名称 CONTOUR SHAPE MEASURING METHOD AND CONTOUR SHAPE MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a contour shape measuring method and a contour shape measuring device in which a contour shape of a measuring object such as a processing tool used for a machine tool can be measured accurately from a change in the quantity of light of a light beam detected by a photodetector by scanning a contour of the measuring object with the light beam. <P>SOLUTION: In a measuring device, regarding light emitted from a light source 20, a measuring object (such as a tool) and its contour T are inserted within a beam range B of the light. While moving the measuring object and its contour T or the beam of light in X and Z directions, based on a change in the quantity of light obtained by detecting the quantity of laser light through a photodetector 21, the measuring object and its contour T are measured/evaluated accurately. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013124889(A) 申请公布日期 2013.06.24
申请号 JP20110272901 申请日期 2011.12.14
申请人 TOHOKU UNIV 发明人 SHIMIZU HIROKI;ZHANG CHENG HAO;KO ISAMU;ASAI TAKEMI;ITO SATOSHI
分类号 G01B11/24;B23Q17/24 主分类号 G01B11/24
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