| 摘要 |
The present invention generally relates to super-resolution microscopy. For example, certain aspects of the invention are generally directed to a microscopy system comprising at least two objectives. In some embodiments, the microscopy system may also contain a non-circularly- symmetric lens. One or more images can be obtained using the objectives, for example, using stochastic imaging techniques such as STORM (stochastic optical reconstruction microscopy), optionally in conjunction with entities that are photoactivatable and/or photo switchable. The images obtained using the objectives may be compared, e.g., to remove noise, and/or to compare an entity present in both images, for instance, to determine the z-position of the entity. In some cases, surprisingly high resolutions may be obtained using such techniques, for example, resolutions of better than about 10 nm. |
