THREE-DIMENSIONAL MEASUREMENT APPARATUS, METHOD FOR THREE-DIMENSIONAL MEASUREMENT, AND COMPUTER PROGRAM

摘要

On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered.