发明名称 Anti-Fuses on Semiconductor Fins
摘要 A device includes a substrate, isolation regions at a surface of the substrate, and a semiconductor region over a top surface of the isolation regions. A conductive feature is disposed over the top surface of the isolation regions, wherein the conductive feature is adjacent to the semiconductor region. A dielectric material is disposed between the conductive feature and the semiconductor region. The dielectric material, the conductive feature, and the semiconductor region form an anti-fuse.
申请公布号 US2013153960(A1) 申请公布日期 2013.06.20
申请号 US201113328944 申请日期 2011.12.16
申请人 YANG HSIAO-LAN;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YANG HSIAO-LAN
分类号 H01L23/525;H01L21/768 主分类号 H01L23/525
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