发明名称 DIAGNOSTIC APPARATUS AND DIAGNOSTIC METHOD
摘要 <p>This diagnostic apparatus obtains, for each of M devices, deterioration determination data candidates that include second cumulative power consumption amounts for that specific device in all combinations in which that specific device is included (S13), identifies, as deterioration determination data for that specific device, the candidate with the lowest second cumulative power consumption amount among the multiple deterioration determination data candidates (S15), and assesses that the specific device has deteriorated if the deterioration determination data is equal to or greater than a threshold value (T1) (S20).</p>
申请公布号 WO2013088841(A1) 申请公布日期 2013.06.20
申请号 WO2012JP77379 申请日期 2012.10.23
申请人 OMRON CORPORATION 发明人 MUKAIGAWA, SHINICHI;MATANO, MASAHIKO;IKUTANI, TADAYUKI;KIOKA, YU;KUNO, TSUTOMU;KAWAMURA, TADAYASU;SENO, KOKI
分类号 G01M99/00;F04B49/10;F04B51/00;G01R22/00 主分类号 G01M99/00
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