发明名称 SAMPLE TABLE FOR MICROSCOPIC OBSERVATION
摘要 <P>PROBLEM TO BE SOLVED: To provide a sample table for microscopic observation which allows for electric conduction of electronic material and observation of the electronic material in electric conduction, concurrently at the same place. <P>SOLUTION: A sample table 1 for microscopic observation which is configured to mount an electric microscope for observing change of an electronic material S over time while supplying a current to the electronic material S placed in a space SP1 that is a closed space, comprises: holding members 8a and 8b for holding the electronic material S; small batteries 6a and 6b for supplying the current to the electronic material S; a microswitch 7 for turning on and off the electric conduction from the small batteries 6a and 6b; a constant-current diode 9 for controlling the current from the small batteries 6a and 6b; and a mounting unit 4 for mounting the electron microscope. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013122893(A) 申请公布日期 2013.06.20
申请号 JP20110271613 申请日期 2011.12.12
申请人 KOBELCO KAKEN:KK 发明人 SUZUKI KOHEI
分类号 H01J37/20 主分类号 H01J37/20
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