发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 In a manufacturing method of a barrier layer, a via hole is formed in an insulating layer that covers a conductive layer over a substrate, and then the barrier layer is formed in the via hole. The barrier layer is provided by forming a second titanium nitride film after forming a first titanium nitride film. The second titanium nitride film is formed using a method having a weak anisotropy than the first titanium nitride film.
申请公布号 US2013154096(A1) 申请公布日期 2013.06.20
申请号 US201213669670 申请日期 2012.11.06
申请人 ELPIDA MEMORY, INC.;ELPIDA MEMORY, INC. 发明人 TANAKA KATSUHIKO
分类号 H01L21/285;H01L23/532 主分类号 H01L21/285
代理机构 代理人
主权项
地址