发明名称 TESTER APPARATUS FOR OBTAINING FORMING LIMIT DIAGRAM
摘要 A tester apparatus capable of obtaining a forming limit diagram pertaining to a sample having a high degree of precision includes a fixing jig and a mobile jig installed at an upper side of the fixing jig so as to enable a vertical movement. The mobile jig may be configured to fix the sample in cooperation with the fixing jig, and a driving apparatus disposed at a lower side of the fixing jig may be configured to drive the vertical movement of the mobile jig. An interlocking apparatus provided in between the mobile jig and the driving apparatus may be configured to deliver a driving force of the driving apparatus to the mobile jig.
申请公布号 US2013152706(A1) 申请公布日期 2013.06.20
申请号 US201213709869 申请日期 2012.12.10
申请人 SAMSUNG ELECTRONICS CO., LTD.;SAMSUNG ELECTRONICS CO., LTD. 发明人 NAM KI JU;LEE JUN BEOM;CHO YONG KYUN
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址
您可能感兴趣的专利