发明名称 MANUFACTURING METHOD OF MASK BLANK, MANUFACTURING METHOD OF TRANSFER MASK, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE: A manufacturing method of a mask blank, a manufacturing method of a transferring mask, and a manufacturing method of a semiconductor device are provided to reduce the film stress of a thin film by forming a thin film containing tantalum. CONSTITUTION: A manufacturing method of a mask blank includes the following steps of: preparing a glass substrate(1) with a mirror-polished main surface; irradiating the glass substrate with light containing an infrared ray wavelength; and forming a thin film on the main surface of the glass substrate. The thin film contains tantalum and substantially no hydrogen. The light irradiated to the glass substrate includes wavelength 1.3 micrometers or more. The light is emitted from a halogen heater. The thin film is formed by being adjacent to the main surface of the glass substrate.</p>
申请公布号 KR20130065616(A) 申请公布日期 2013.06.19
申请号 KR20120141905 申请日期 2012.12.07
申请人 HOYA CORPORATION 发明人 UMEZAWA TEIICHIRO;ISHIYAMA MASAFUMI;NOZAWA OSAMU
分类号 G03F1/68;H01L21/027 主分类号 G03F1/68
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