发明名称 IN-SITU ASSESSMENT METHOD AND SYSTEM IN MICRO-MACHINING BY LASER RAIL-ROADING TECHNIQUE
摘要 PURPOSE: A method and apparatus for evaluating a process in a laser railroad process are provided to improve a measurement speed by using reflected laser light. CONSTITUTION: A thin film(520) is laminated on a wafer(510). A process object(500) is formed on the wafer. A pattern is formed in the process object. The process object is cut down. The surface of the process object is tested by a micro-process method.
申请公布号 KR101276637(B1) 申请公布日期 2013.06.19
申请号 KR20110133482 申请日期 2011.12.13
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 JEOUNG, SAE CHAE;LEE, HEUNG SOON;LEE, HYUN KYU
分类号 H01L21/66 主分类号 H01L21/66
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