发明名称 Processor test apparatus, processor test method, and processor test program
摘要 A processor test method of testing a processor includes executing each test instruction of a test instruction sequence to obtain a condition code set by a condition code setting instruction of the test instruction sequence for testing the processor; producing a condition branching instruction to add the produced condition branching instruction to the end of the condition code setting instruction of the test instruction sequence, the condition branching instruction branching to an error output instruction when a condition code that does not match the obtained condition code is supplied; and executing, by an advanced control scheme, a test instruction sequence in which the condition branching instruction is added to the test instruction sequence.
申请公布号 US8468327(B2) 申请公布日期 2013.06.18
申请号 US20090644822 申请日期 2009.12.22
申请人 TAKAO HIROSHI;FUJITSU LIMITED 发明人 TAKAO HIROSHI
分类号 G06F7/38;G06F9/00;G06F9/44;G06F15/00 主分类号 G06F7/38
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