发明名称 COMPOUND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a compound semiconductor device capable of obtaining a high gain while suppressing current collapse, and provide a manufacturing method of the compound semiconductor device. <P>SOLUTION: A compound semiconductor device comprises: a substrate 11; a nitride compound semiconductor laminate structure 12 formed above the substrate 11; and a gate electrode 13, a source electrode 14a and a drain electrode 14d, which are formed above the compound semiconductor laminate structure 12. The compound semiconductor device further comprises a recess 32 formed on a surface of the compound semiconductor laminate structure 12 and between the gate electrode 13 and the drain electrode 14d in plan view. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013120854(A) 申请公布日期 2013.06.17
申请号 JP20110268237 申请日期 2011.12.07
申请人 FUJITSU LTD 发明人 MAKIYAMA KOZO
分类号 H01L21/338;H01L21/336;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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