发明名称 IN SITU BATTERY FRAME FOR MEASURING X-RAY DIFFRACTION
摘要 <p>PURPOSE: An in-situ battery frame for analyzing X-ray diffraction is provided to prevent the movement of a cell by adding pressure properly to the cell using a cell fixing plate and a spring which are installed inside. CONSTITUTION: An in-situ battery frame for analyzing X-ray diffraction comprises a cell body(20), an upper plate(40), a lower plate(10), a beryllium plate(30), a cell fixing plate(60), and an insulating sheet(50). The insulating sheet, the beryllium plate, and the upper plate are joined to the top surface of the cell body in regular sequences. The lower plate is joined to the underside of the cell. A cell(80) is arranged inside the cell body. The cell is fixed between the cell fixing plate and the insulating sheet by a spring(61) positioned underneath the cell fixing plate. The cell fixing plate includes a cell fixing plate spring groove and an O-ring groove(25). The spring is mounted on the cell fixing plate spring groove to fix the cell. The O-ring groove is formed in the lateral surface of the cell fixing plate for fixing an O-ring(70).</p>
申请公布号 KR101274730(B1) 申请公布日期 2013.06.17
申请号 KR20120112740 申请日期 2012.10.11
申请人 INDUSTRY-ACADEMIC COOPERATION FOUNDATION, KUNSAN NATIONAL UNIVERSITY 发明人 SHIM, JUNG PYO;SEON, HO JEONG;PARK, GYEONG SE;PARK, EUNG WON
分类号 G01N23/20;H01M10/00 主分类号 G01N23/20
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