UNIVERSAL SOCKET FOR ELECTRICAL TEST

摘要

PURPOSE: A common socket for electrical inspection is provided to omit manufacture of a separate inspection socket by using a common socket for electrical inspection in electrical inspection of a newly developed semiconductor package. CONSTITUTION: As socket pins(134) are perpendicularly arranged in a matrix form in a common connection unit body(130), an electrical connection unit is formed. According to a size of a semiconductor package to be inspected and the number of external connection terminals, a size of a semiconductor package mount unit(112) is modified in an upper structure(110A) of a socket. An engagement unit(120) attaches and detaches the common connection unit body and the upper structure of a socket and includes an engagement hole, an elastic guide and an engagement hole.