发明名称 PROBE CLEANING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a probe cleaning device cleaning a probe in a short time. <P>SOLUTION: This probe cleaning device includes: a probe connection part connected to a rear end part of the probe having a suction pipe and a discharge pipe; and a suction machine sucking a gas, removing dust from the gas, and discharging it. If a rear end part of the suction pipe and a gas suction side of the suction machine are connected, if a rear end part of the discharge pipe and a gas exhaust side of the suction machine are connected and if a tip part of the suction pipe and a tip side of the discharge pipe are connected, when cleaning the probe, a closed loop using the suction machine, the discharge pipe and the suction pipe is configured. If the closed loop is configured when cleaning the probe, the suction machine circulates a cleaning gas sent from a gas supply source in order of the discharge pipe, the suction pipe, and the suction machine. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013119048(A) 申请公布日期 2013.06.17
申请号 JP20110267319 申请日期 2011.12.06
申请人 TOSHIBA CORP 发明人 ETO HIDEO;SAITO MAKOTO;FUJIWARA YOSHIMITSU;SATO MASAHIDE
分类号 B08B7/04;B08B6/00;B08B9/02 主分类号 B08B7/04
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