发明名称 SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface inspection method capable of using an inspection recipe common in a plurality of surface inspection devices regardless of a difference in a spatial filter of each surface inspection device of the plurality of surface inspection devices. <P>SOLUTION: A surface inspection method includes: displaying a Fourier image opening part of a surface inspection device No.1 with n set to 1, and moving a spatial filter to an original point, and acquiring a reference stop pixel value at the position of the original point (steps 6001 to 6004); moving the spatial filter by a fixed movement amount for off-set calculation and calculating the movement amount from the original point, and if n=1, storing an off-set value, a movement amount, and a reference stop position of the surface inspection device No.1 (steps 6005 to 6008); executing the steps 6002 to 6007 and 6009 in order to perform processing of a surface inspection device No. 2 with n=n+1; and repeatedly executing the flow until n becomes equal to N, and calculating spatial filer movement amounts and movement amount coefficients of surface inspection devices No.3 to N by using the spatial filter movement amount and movement amount coefficient of the surface inspection deice No.1 as a reference, and storing the results. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013117465(A) 申请公布日期 2013.06.13
申请号 JP20110265601 申请日期 2011.12.05
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 BANBA YOSHIO;FUKUSHIMA HIDEKI;MIKI ATSUSHI
分类号 G01N21/956;G01B11/30;H01L21/66 主分类号 G01N21/956
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