发明名称 |
POLISHING LIQUID FOR TSV BLOCKING LAYER |
摘要 |
<p>A chemical-mechanical polishing liquid, applicable to a through-silicon-via (TSV) blocking layer, at least comprises an abrasive, a composite copper corrosion inhibitor, a complexing agent, and a silicon nitride modifier. The polishing liquid has a high silicon dioxide removal speed and a low silicon nitride removal speed, so as to implement effective planarization on the blocking layer and stop the silicon nitride layer, so as to form a through-silicon hole, and at the same time not to cause metal corrosion, thereby achieving the high defect correction capability and the low surface pollutant index.</p> |
申请公布号 |
WO2013082863(A1) |
申请公布日期 |
2013.06.13 |
申请号 |
WO2012CN01016 |
申请日期 |
2012.07.30 |
申请人 |
ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;SONG, WEIHONG;YAO, YING;SUN, ZHANLONG |
发明人 |
SONG, WEIHONG;YAO, YING;SUN, ZHANLONG |
分类号 |
C09G1/02 |
主分类号 |
C09G1/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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