发明名称 POLISHING LIQUID FOR TSV BLOCKING LAYER
摘要 <p>A chemical-mechanical polishing liquid, applicable to a through-silicon-via (TSV) blocking layer, at least comprises an abrasive, a composite copper corrosion inhibitor, a complexing agent, and a silicon nitride modifier. The polishing liquid has a high silicon dioxide removal speed and a low silicon nitride removal speed, so as to implement effective planarization on the blocking layer and stop the silicon nitride layer, so as to form a through-silicon hole, and at the same time not to cause metal corrosion, thereby achieving the high defect correction capability and the low surface pollutant index.</p>
申请公布号 WO2013082863(A1) 申请公布日期 2013.06.13
申请号 WO2012CN01016 申请日期 2012.07.30
申请人 ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;SONG, WEIHONG;YAO, YING;SUN, ZHANLONG 发明人 SONG, WEIHONG;YAO, YING;SUN, ZHANLONG
分类号 C09G1/02 主分类号 C09G1/02
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