发明名称 SENSE OPERATION IN A MEMORY DEVICE
摘要 Methods for sensing and memory devices are disclosed. One such method for sensing determines a threshold voltage of an n-bit memory cell that is adjacent to an m-bit memory cell to be sensed. A control gate of the m-bit memory cell to be sensed is biased with a sense voltage adjusted responsive to the determined threshold voltage of the n-bit memory cell.
申请公布号 US2013148426(A1) 申请公布日期 2013.06.13
申请号 US201313762559 申请日期 2013.02.08
申请人 MICRON TECHNOLOGY, INC.;MICRON TECHNOLOGY, INC. 发明人 ZHAO YIJIE;GODA AKIRA;HELM MARK A.
分类号 G11C16/04 主分类号 G11C16/04
代理机构 代理人
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