发明名称 ATTENUATED TOTAL REFLECTION (ATR) SPECTROSCOPY AND SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and system for detecting a sample by a detector from different sites, and for accumulating space images. <P>SOLUTION: An accessory to be used for a microscope arranged to execute ATR measurement has a base plate (40) which may be attached on a movable stage (20) of a micro-cope. An attachment arm (100) for ATR crystal is supported on a support body. It is desired that the attachment arm (100) is attached in a revolving type on the base plate (40) so as to revolve from a position where crystal is aligned on the axis of the microscope to a position where a sample supported on the support body is visually observable. The attachment stand is arranged so as to be surely and reproducibly returned to the original position of the attachment stand where crystal is positioned on the axis. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013117549(A) 申请公布日期 2013.06.13
申请号 JP20130057955 申请日期 2013.03.21
申请人 PERKINELMER SINGAPORE PTE LTD 发明人 ROBERT ALAN HOULT;RALPH LANCE CARTER;WILKINSON ANTONIO CANAS;PAUL STYLES
分类号 G01N21/27 主分类号 G01N21/27
代理机构 代理人
主权项
地址