发明名称 |
ALIGNMENT METHOD FOR ASSEMBLING SUBSTRATES WITHOUT FIDUCIAL MARK |
摘要 |
An alignment method for assembling substrates without fiducial mark is provided and has steps of: pre-defining at least two partially standard character regions; capturing at least two partially actual images of a first substrate; comparing to obtain at least two partially actual character regions; building an actual coordinate system of the first substrate; comparing the actual coordinate system with a coordinate system of a second substrate to obtain three types of offset values; moving the first substrate to a correct waiting position based on the offset values; ensuring if the first substrate is disposed at the correct waiting position; and stacking the first substrate with the second substrate to finish the alignment and installation. Thus, the alignment method of the present invention can be applied to to-be-installed substrates without any fiducial mark for alignment.
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申请公布号 |
US2013148878(A1) |
申请公布日期 |
2013.06.13 |
申请号 |
US201213352323 |
申请日期 |
2012.01.17 |
申请人 |
LIN CHORNG-TYAN;WEN CHIH-CHIN;YANG CHUN-MING;YANG JWU-JIUN;METAL INDUSTRIES RESEARCH & DEVELOPMENT CENTRE |
发明人 |
LIN CHORNG-TYAN;WEN CHIH-CHIN;YANG CHUN-MING;YANG JWU-JIUN |
分类号 |
G06K9/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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