发明名称 WAFER DICING EMPLOYING EDGE REGION UNDERFILL REMOVAL
摘要 In one embodiment, a dielectric material layer embedding metal structures is ablated from the chip-containing substrate by laser grooving, which is performed on dicing channels of the chip-containing substrate. Subsequently, an underfill layer is formed over the dielectric material layer in a pattern that excludes the peripheral areas of the chip-containing substrate. The physically exposed dicing channels at the periphery can be employed to align a blade to dice the chip-containing substrate. In another embodiment, an underfill layer is formed prior to any laser grooving. Mechanical cutting of the underfill layer from above dicing channels is followed by laser ablation of the dicing channels and subsequent mechanical cutting to dice a chip-containing substrate.
申请公布号 US2013149841(A1) 申请公布日期 2013.06.13
申请号 US201213474090 申请日期 2012.05.17
申请人 INDYK RICHARD F.;NAH JAE-WOONG;KATSURAYAMA SATORU;OKA DAISUKE;OKADA SHIGEFUMI;INTERNATIONAL BUSINESS MACHINES CORPORATION;DISCO CORPORATION;SUMITOMO BAKELITE COMPANY LTD. 发明人 INDYK RICHARD F.;NAH JAE-WOONG;KATSURAYAMA SATORU;OKA DAISUKE;OKADA SHIGEFUMI
分类号 H01L21/78 主分类号 H01L21/78
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