发明名称 |
NOISE CHARACTERISTIC ANALYSIS METHOD FOR X-RAY FLUORESCENCE SPECTRUM |
摘要 |
PURPOSE: A method for analyzing noise properties of a fluorescence X-ray spectrum is provided to improve the accuracy of an analysis of the fluorescence X-ray spectrum by analyzing noise properties. CONSTITUTION: A method for analyzing noise properties of a fluorescence X-ray spectrum is as follows. A fluorescence X-ray detector irradiates X-rays to a reference sample in which preset substances are mixed at a preset rate for analyzing noise properties of the fluorescence X-ray spectrum, sorts the fluorescence X-ray energy generated from the sample for a predetermined period into a plurality of channels according to an energy level for a predetermined period, and counts the sorted channels. The process obtaining the fluorescence X-ray spectrum is repeated several times. The number that the fluorescence X-ray energy with respect to each of the channels is actually counted is substituted to a Poisson distribution function so that the probability that an expected count number is observed for the predetermined period is calculated. The standard deviation of the count number is calculated. |
申请公布号 |
KR101273714(B1) |
申请公布日期 |
2013.06.12 |
申请号 |
KR20120030524 |
申请日期 |
2012.03.26 |
申请人 |
INDUSTRIAL COOPERATION FOUNDATION CHONBUK NATIONAL UNIVERSITY |
发明人 |
CHON, SUN IL;YANG, SANG HOON;PARK, DONG SUN;LEE, JAE HWAN |
分类号 |
G01N23/223 |
主分类号 |
G01N23/223 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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