发明名称 PROCESS FOR PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 <p>A method for manufacturing a high-quality semiconductor device having stable characteristics is provided. The method for manufacturing the semiconductor device includes the steps of: preparing a silicon carbide layer (2 to 4) having a main surface; forming a trench (16) in the main surface by removing a portion of the silicon carbide layer (2 to 4); and removing a portion of a side wall of the trench (16) by thermal etching.</p>
申请公布号 EP2602824(A1) 申请公布日期 2013.06.12
申请号 EP20110814584 申请日期 2011.07.29
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 MASUDA, TAKEYOSHI
分类号 H01L29/12;H01L21/3065;H01L21/336;H01L29/78 主分类号 H01L29/12
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