发明名称 |
PROCESS FOR PRODUCTION OF SEMICONDUCTOR DEVICE |
摘要 |
<p>A method for manufacturing a high-quality semiconductor device having stable characteristics is provided. The method for manufacturing the semiconductor device includes the steps of: preparing a silicon carbide layer (2 to 4) having a main surface; forming a trench (16) in the main surface by removing a portion of the silicon carbide layer (2 to 4); and removing a portion of a side wall of the trench (16) by thermal etching.</p> |
申请公布号 |
EP2602824(A1) |
申请公布日期 |
2013.06.12 |
申请号 |
EP20110814584 |
申请日期 |
2011.07.29 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
MASUDA, TAKEYOSHI |
分类号 |
H01L29/12;H01L21/3065;H01L21/336;H01L29/78 |
主分类号 |
H01L29/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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