发明名称 Post-CMP wafer cleaning apparatus
摘要 A post-CMP wafer cleaning apparatus includes a chamber; a plurality of rollers adapted to hold and rotate a wafer within the chamber; at least one brush adapted to scrub a surface of the wafer to be cleaned; and a liquid spraying device adapted to spray a liquid on the wafer, the liquid spraying device comprising two spray bars jointed together via a joint member.
申请公布号 US8458842(B2) 申请公布日期 2013.06.11
申请号 US201113104964 申请日期 2011.05.10
申请人 LIU LI-CHUNG;CHEN YI-NAN;LIU HSIEN-WEN;NANYA TECHNOLOGY CORP. 发明人 LIU LI-CHUNG;CHEN YI-NAN;LIU HSIEN-WEN
分类号 B08B3/02 主分类号 B08B3/02
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