发明名称 |
Logic built-in self-test system and method for applying a logic built-in self-test to a device under test |
摘要 |
A logic built-in self test (LBIST) system comprises a device under test having a first plurality of first bistable multivibrator circuits an LBIST controller, and a second plurality of second bistable multivibrator circuits. Each second bistable multivibrator circuit is coupled to a corresponding first bistable multivibrator circuit to swap a second state value kept by the second bistable multivibrator circuit with a first state value kept by the corresponding first bistable multivibrator circuit depending on a first control signal from the LBIST controller and the second bistable multivibrator circuits are coupled to form one or more scan chains when receiving a second control signal from the LBIST controller.
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申请公布号 |
US8461865(B2) |
申请公布日期 |
2013.06.11 |
申请号 |
US200813126854 |
申请日期 |
2008.11.24 |
申请人 |
SCHLAGENHAFT ROLF;FREESCALE SEMICONDUCTOR, INC. |
发明人 |
SCHLAGENHAFT ROLF |
分类号 |
H03K19/00;H03K19/173 |
主分类号 |
H03K19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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