| 摘要 |
A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value Phi0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors beta, gamma regarding stray light in the reference measurement, an analysis value Phi of the luminescence quantum yield with the effect of stray light reduced by Phi=betaPhi0+gamma. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.
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