发明名称 SYSTEM AND MTEHOD FOR CHARGED PARTICLE IRRADIATION
摘要 <P>PROBLEM TO BE SOLVED: To provide a system and a method for charged particle irradiation which is capable of shortening the irradiation time and shortening the treatment time by performing efficient irradiation even when irregular variation occurs in an object to be irradiated during gate irradiation. <P>SOLUTION: Beam emission is stopped by regular emission permission end signal reception by regular movement signals. In the meantime, an emission possible state maintaining function 46b is activated by emission permission end signal reception. When set standby time elapses without receiving an emission permission start signal again during standby, the operation of the emission possible state maintaining function 46b ends. A charged particle beam generator 1 decelerates the beam. Sometimes the beam emission is stopped by irregular emission permission end signal reception during irradiation. In the meantime, the emission possible state maintaining function 46b is activated by the emission permission end signal reception, and the charged particle beam generator 1 maintains an emission possible state. When the emission permission start signal is received again during standby, the beam emission is restarted. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013111406(A) 申请公布日期 2013.06.10
申请号 JP20110262978 申请日期 2011.11.30
申请人 HITACHI LTD;HOKKAIDO UNIV 发明人 FUJII YUSUKE;UMEKAWA TORU;UMEZAWA MASUMI;SHIRATO HIROKI;UMEGAKI KIKUO;MIYAMOTO NAOKI;MATSUURA TAEKO
分类号 A61N5/10 主分类号 A61N5/10
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