发明名称 SOLDER POSITION ANALYSIS DEVICE, SUBSTRATE APPEARANCE INSPECTION DEVICE, SOLDER POSITION ANALYSIS METHOD AND SOLDER POSITION ANALYSIS PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a technology of acquiring a position on a substrate of a solder to which a terminal of a component is not to be connected. <P>SOLUTION: A solder position analysis method comprises: acquiring printing positions of a solder on a substrate; acquiring a connection position that is a position on the substrate of a solder to which a terminal of a component is to be connected; and acquiring a position excluding the connection position from the printing positions as a non-connection position that is a position on the substrate of a solder to which the terminal of the component is not to be connected. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013115194(A) 申请公布日期 2013.06.10
申请号 JP20110259231 申请日期 2011.11.28
申请人 NAGOYA ELECTRIC WORKS CO LTD 发明人 KATO MASANORI
分类号 H05K3/34;G01B11/00;G01N21/956 主分类号 H05K3/34
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