发明名称 |
SOLDER POSITION ANALYSIS DEVICE, SUBSTRATE APPEARANCE INSPECTION DEVICE, SOLDER POSITION ANALYSIS METHOD AND SOLDER POSITION ANALYSIS PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a technology of acquiring a position on a substrate of a solder to which a terminal of a component is not to be connected. <P>SOLUTION: A solder position analysis method comprises: acquiring printing positions of a solder on a substrate; acquiring a connection position that is a position on the substrate of a solder to which a terminal of a component is to be connected; and acquiring a position excluding the connection position from the printing positions as a non-connection position that is a position on the substrate of a solder to which the terminal of the component is not to be connected. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013115194(A) |
申请公布日期 |
2013.06.10 |
申请号 |
JP20110259231 |
申请日期 |
2011.11.28 |
申请人 |
NAGOYA ELECTRIC WORKS CO LTD |
发明人 |
KATO MASANORI |
分类号 |
H05K3/34;G01B11/00;G01N21/956 |
主分类号 |
H05K3/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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