摘要 |
PURPOSE: A method and a device for detecting the abnormality of electrode patterns are provided to compare the electrode patterns and patterns of lights projected on a pattern mask, thereby determining the existence of the abnormality of the electrode patterns. CONSTITUTION: A device(100) for detecting the abnormality of electrode patterns comprises a light emitting unit(110), a pattern mask(120), and a sensing determining unit(150). Lights are irradiated on the pattern mask. The sensing determining unit compares the pattern mask and the electrode patterns by using the lights which are irradiated to the pattern mask and projected on the same and determines the electrode patterns as a normal condition if a distance between the pattern mask and the electrode patterns is within a preset error range.
|