发明名称 SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES
摘要 <p>PURPOSE: A semiconductor device and a method for manufacturing the semiconductor device are provided to prevent the parasitic capacitance between floating gates by forming a deep air gap extended to the floating gates of gate patterns. CONSTITUTION: A tunnel insulating layer is formed on a substrate(100). Gate patterns(160) are formed on the tunnel insulating layer. A capping layer pattern(170a) is formed on the sidewall of the gate pattern and a tunnel insulating layer. A tunnel insulating pattern(110a) is formed in the active area of the substrate. An insulating layer(180) covering the gate pattern and the capping layer pattern is formed on the tunnel insulating pattern. An air gap(185) is formed in the insulating layer between the adjacent capping layer patterns. [Reference numerals] (AA) Second direction; (BB) First direction</p>
申请公布号 KR20130060419(A) 申请公布日期 2013.06.10
申请号 KR20110126460 申请日期 2011.11.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, SUNG SOO;KWON, O IK;KIM, BUM SOO;KIM, HYUN SUNG;SHIN, KYOUNG SUB;YUN, MIN KYUNG;CHUNG, SEUNG PIL;JUNG, WON BONG
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
代理机构 代理人
主权项
地址