发明名称 TEST SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide a test system in which efficiency of a test can be improved in a test item selection technique of a test apparatus which tests a plurality of test items for a device to be tested. <P>SOLUTION: A test system comprises an RFID tag, a reader, a test cable presence/absence determination section 135 and a test cable absence display section 136. The RFID tag is mounted on each test cable and stores identification information of each test cable. The reader reads the identification information from the RFID tag. The test cable presence/absence determination section 135 determines the situation where the test cable to be used for each test item is present or absence by collating presence/absence information of each test cable generated on the basis of the identification information stored in the RFID tag read by the reader with the identification information of the test cable used for each test item. In the case where a first test cable is absent, on the basis of a result of the determination, the test cable absence display section 136 displays a symbol indicating the absence of the first test cable for a test item that uses the first test cable, in a test item selection row on a test screen. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013113700(A) 申请公布日期 2013.06.10
申请号 JP20110259807 申请日期 2011.11.29
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 KAJIYAMA TERUAKI
分类号 G01R31/00;G01D21/00 主分类号 G01R31/00
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