发明名称 |
FILM FORMATION METHOD OF SILICON OXIDE FILM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a film formation method of silicon oxide film capable of obtaining a silicon oxide film having excellent surface roughness. <P>SOLUTION: The film formation method of a silicon oxide film comprises the steps of: forming a seed layer 2 on a base substrate 1; forming a silicon film 3 on the seed layer 2; and forming a silicon oxide film 4 on the base substrate 1 by oxidizing the silicon film 3 and the seed layer 2. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013110385(A) |
申请公布日期 |
2013.06.06 |
申请号 |
JP20120204155 |
申请日期 |
2012.09.18 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
MURAKAMI HIROKI;IKEUCHI TOSHIYUKI;SATO JUN;MOROZUMI YUICHIRO;HASEBE KAZUHIDE |
分类号 |
H01L21/316;C23C16/24;C23C16/56 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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