发明名称 FILM FORMATION METHOD OF SILICON OXIDE FILM
摘要 <P>PROBLEM TO BE SOLVED: To provide a film formation method of silicon oxide film capable of obtaining a silicon oxide film having excellent surface roughness. <P>SOLUTION: The film formation method of a silicon oxide film comprises the steps of: forming a seed layer 2 on a base substrate 1; forming a silicon film 3 on the seed layer 2; and forming a silicon oxide film 4 on the base substrate 1 by oxidizing the silicon film 3 and the seed layer 2. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013110385(A) 申请公布日期 2013.06.06
申请号 JP20120204155 申请日期 2012.09.18
申请人 TOKYO ELECTRON LTD 发明人 MURAKAMI HIROKI;IKEUCHI TOSHIYUKI;SATO JUN;MOROZUMI YUICHIRO;HASEBE KAZUHIDE
分类号 H01L21/316;C23C16/24;C23C16/56 主分类号 H01L21/316
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