发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT, AND OPTICAL SENSOR APPARATUS USING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To reduce the number of blown fuses with respect to manufactured articles for which characteristic values before correction are within a range of a mean value &plusmn; 2&times;(standard deviation) in the appearance frequency distribution of the characteristic values. <P>SOLUTION: A resistance array is provided in a device array 14, the mean value of the distribution of the characteristic values is associated with the center value of a combined resistance value obtained in the device array 14, the arrangement of trimming information corresponding to a combined resistance value larger than the center value in a trimming information generating circuit 12 is set in a descending order of [15] to [8] by decimal numbers, and the arrangement of trimming information corresponding to a combined resistance value equal to or less than the center value is set in ascending order of [0] to [7] by decimal numbers. A conversion circuit 13 converts the trimming information from the trimming information generating circuit 12, and generates device selection information for selecting a resistance turned off to obtain each combined resistance value from the resistance array of the device array 14. In this way, the number of blown fuses is substantially cut down when generating the trimming information associated with tha range of [mean value &plusmn; 2&sigma;] in the distribution. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013110368(A) 申请公布日期 2013.06.06
申请号 JP20110256566 申请日期 2011.11.24
申请人 SHARP CORP 发明人 NODA KAZUO;INOUE TAKAHIRO
分类号 H01L21/82;H01L21/822;H01L27/04;H01L31/12 主分类号 H01L21/82
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