发明名称 NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor storage device having high controllability, and provide a manufacturing method of the nonvolatile semiconductor storage device. <P>SOLUTION: A nonvolatile semiconductor storage device comprises: a first memory cell array layer; a first insulation layer formed on the first memory cell array layer; a second memory cell array layer formed on the first insulation layer; a control gate formed via an inter-gate insulation layer, on both lateral faces in a first direction of first and second floating gates vertically positioned via a first insulation layer, and extending in a second direction orthogonal to the first direction; and an auxiliary gate formed via the inter-gate insulation layer, on both lateral faces in the first direction of the first and second floating gates vertically positioned via the first insulation layer, and extending in the second direction, and forming an auxiliary transistor together with first and second semiconductor layers and first and second gate insulation layers. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013110265(A) 申请公布日期 2013.06.06
申请号 JP20110253928 申请日期 2011.11.21
申请人 TOSHIBA CORP 发明人 KOBAYASHI TAKASHI;KOMIYA KEN
分类号 H01L21/8247;H01L21/336;H01L27/10;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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