发明名称 SURFACE DEFECT INSPECTION DEVICE AND SURFACE DEFECT INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a surface defect inspection device and a surface defect inspection method which surely detect mainly seed defects and scratch defects on a coated surface, relating to techniques of detecting surface defects. <P>SOLUTION: A surface defect inspection device includes: an illumination part applying an illumination pattern in which hue periodically changes at least in two directions on a plane surface to reference and inspection surfaces; an imaging part imaging the reference and inspection surfaces to which the illumination pattern has been applied; and a defect detecting part detecting the existence of defects on the inspection surface on the basis of the hue difference between both images which have been imaged by the imaging part. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013108944(A) 申请公布日期 2013.06.06
申请号 JP20110256328 申请日期 2011.11.24
申请人 FUJITSU LTD 发明人 NAGATO TAKESHI;FUSE TAKASHI;TAKAHASHI FUMIYUKI;TSUKAHARA HIROYUKI
分类号 G01N21/892;G01N21/84 主分类号 G01N21/892
代理机构 代理人
主权项
地址