发明名称 |
Dynamic Design Partitioning For Diagnosis |
摘要 |
Aspects of the invention relate to techniques for fault diagnosis based on dynamic circuit design partitioning. According to various implementations of the invention, a sub-circuit is extracted from a circuit design based on failure information of one or more integrated circuit devices. The extraction process may comprise combining fan-in cones of failing observation points included in the failure information. The extraction process may further comprise adding fan-in cones of one or more passing observation points to the combined fan-in cones of the failing observation points. Clock information of test patterns and/or layout information of the circuit design may be extracted and used in the sub-circuit extraction process. The extracted sub-circuit may then be used for diagnosing the one or more integrated circuit devices.
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申请公布号 |
US2013145213(A1) |
申请公布日期 |
2013.06.06 |
申请号 |
US201213680447 |
申请日期 |
2012.11.19 |
申请人 |
MENTOR GRAPHICS CORPORATION;MENTOR GRAPHICS CORPORATION |
发明人 |
TANG HUAXING;HUANG YU;CHENG WE-TUNG;BENWARE ROBERT BRADY;FAN XIAOXIN |
分类号 |
G06F11/26 |
主分类号 |
G06F11/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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