发明名称 |
APPARATUS HAVING INDICATIONS OF MEMORY CELL DENSITY AND METHODS OF THEIR DETERMINATION AND USE |
摘要 |
<p>Methods and apparatus utilizing indications of memory cell density facilitate management of memory density of a memory device. By permitting each of a plurality of portions of a memory array of the memory device to be assigned a corresponding memory cell density determined through an evaluation of those portions of the memory array, better performing portions of the memory array may not be hindered by lesser performing portions of the memory array.</p> |
申请公布号 |
WO2013082011(A1) |
申请公布日期 |
2013.06.06 |
申请号 |
WO2012US66625 |
申请日期 |
2012.11.27 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
ROOHPARVAR, FRANKIE F.;SARIN, VISHAL |
分类号 |
G11C16/06;G11C7/10 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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