发明名称 |
CPU POWER TESTING APPARATUS AND METHOD |
摘要 |
A CPU power testing apparatus includes a CPU power supplying circuit; a first A/D converter connected with an input of the CPU power supplying circuit. The first A/D converter obtains an input voltage of the CPU power supplying circuit and converts the input voltage into digital values Vin. A second A/D converter connected with an output of the CPU power supplying circuit obtains an output voltage of the CPU power supplying circuit and converts the output voltage into digital values Vout. A single-chip microcontroller obtains Vin from the first A/D converter, and Vout from the second A/D converter, and the system parameters of an application platform, and calculates and displays an amount of the power being consumed by the CPU according to a predetermined formula.
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申请公布号 |
US2013144545(A1) |
申请公布日期 |
2013.06.06 |
申请号 |
US201113327770 |
申请日期 |
2011.12.16 |
申请人 |
FU YING-BIN;GE TING;PAN YA-JUN;HON HAI PRECISION INDUSTRY CO., LTD.;HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO. LTD. |
发明人 |
FU YING-BIN;GE TING;PAN YA-JUN |
分类号 |
G06F19/00;G01R21/133 |
主分类号 |
G06F19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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