发明名称 SOLID STATE IMAGING DEVICE AND DISTANCE IMAGE MEASUREMENT DEVICE
摘要 A pair of first gate electrodes IGR, IGL are provided on a semiconductor substrate 100 so that potentials Æ TX1 , Æ TX2 between a light-sensitive area SA and a pair of first accumulation regions AR, AL alternately ramp. A pair of second gate electrodes IGR, IGL are provided on the semiconductor substrate 100 so as to control the height of first potential barriers Æ BG each interposed between the first accumulation region AR, AL and a second accumulation region FDR, FDL, and increase the height of the first potential barrier Æ BG to carriers as a higher output of a background light is detected by a photodetector.
申请公布号 EP2187237(A4) 申请公布日期 2013.06.05
申请号 EP20080827639 申请日期 2008.08.22
申请人 HAMAMATSU PHOTONICS K.K. 发明人 MASE, MITSUHITO;MIZUNO, SEIICHIRO;TAKEMURA, MITSUTAKA
分类号 G01S7/486;G01C3/06;G01S7/51;G01S17/10;G01S17/89;H01L27/146;H04N5/235;H04N5/335;H04N5/355;H04N5/374;H04N5/3745 主分类号 G01S7/486
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