发明名称 Variable resistance memory device having equal resistances between signal paths regardless of location of memory cells within the memory array
摘要 A memory device including variable resistance elements comprises a plurality of memory cells configured to store data; a first signal transmission/reception unit and a second signal transmission/reception unit configured to transmit a signal to the memory cells or receive a signal from the memory cells; a first transmission line arranged to couple first ends of the memory cells to the first signal transmission/reception unit; and a second transmission line configured to couple second ends of the memory cells to the second signal transmission/reception unit, wherein a first resistance of a first signal path coupled between the first and second signal transmission/reception units through a first memory cell of the memory cells is substantially equal to a second electrical resistance of a second signal path coupled between a second memory cell and the first and second signal transmission/reception units through a second memory cell of the memory cells.
申请公布号 US8456930(B2) 申请公布日期 2013.06.04
申请号 US20100899985 申请日期 2010.10.07
申请人 HWANG SANG MIN;HYNIX SEMICONDUCTOR INC. 发明人 HWANG SANG MIN
分类号 G11C7/02 主分类号 G11C7/02
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